microLED measurement system-軒運科技有限公司-半導體設備廠商

Max Luck Technology Inc.


microLED measurement system

Optoelectronic Equipment

microLED measurement system

PL and EL on the same equipment 30 minutes quick measurement

· Measurement: Optical, spectral and structural characteristics of MicroLED pixels, as well as defects
 Map: Suitable for detecting large wafers in defective areas
· Detection: Nano-pixel photoluminescence (PL) and electroluminescence (EL)
· Characterization: the optical characteristics, spectral characteristics, structural characteristics and defects of each pixel