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Optoelectronic Equipment
microLED measurement system
PL and EL on the same equipment 30 minutes quick measurement
· Measurement: Optical, spectral and structural characteristics of MicroLED pixels, as well as defects
Map: Suitable for detecting large wafers in defective areas
· Detection: Nano-pixel photoluminescence (PL) and electroluminescence (EL)
· Characterization: the optical characteristics, spectral characteristics, structural characteristics and defects of each pixel
